Insect trap using uv led lamp

ABSTRACT

The present disclosure relates to an insect trap using an ultraviolet light-emitting diode (UV LED) lamp, and more particularly, to an insect trap using, in place of a conventional UV light source lamp, a UV LED lamp that significantly increases the insect trapping efficiency. The insect trap according to the present disclosure includes: a UV LED lamp disposed in an air inlet portion of the duct, and including a printed circuit board (PCB) that has a UV LED chip mounted thereon; an installing portion for installing the UV LED lamp on; and a trapping portion provided near the installing portion.

BACKGROUND

1. Technical Field

The present disclosure relates to an insect trap using an ultravioletlight-emitting diode (UV LED) lamp, and more particularly, to an insecttrap using, in place of a conventional UV light source lamp, a UV LEDlamp that significantly increases the insect trapping efficiency.

2. Related Art

UV light sources have been used for medical purposes such assterilization, disinfection and the like, the purpose of analysis basedon changes in irradiated UV light, industrial purposes such as UVcuring, cosmetic purposes such as UV tanning, and other purposes such asinsect trapping, counterfeit money discrimination and the like.

Conventional UV light source lamps that are used as such UV lightsources include mercury lamps, excimer lamps, deuterium lamps and thelike. However, such conventional lamps all have problems in that thepower consumption and heat generation are high, the life span is short,and toxic gas filled therein causes environmental pollution.

As an alternative to overcome the above-described problems of the UVlight source lamps, UV LEDs have attracted attention. UV LEDs areadvantageous in that they have low power consumption and cause noenvironmental pollution. However, the production cost of LED packagesthat emit light in the UV range is considerably higher than theproduction cost of LED packages that emit light in the visible range,and various products using UV LED packages have not been developed sincethe characteristics of UV light is quite different from thecharacteristics of light in the visible range.

In addition, even when a UV LED is applied to a conventional UV lightsource lamp product instead of the UV light source lamp, theconventional UV light source lamp product does not exhibit its effect inmany cases, because the light-emission characteristics of the UV LEDdiffer from those of the conventional UV light source lamp.

For example, in the case of an insect trap, the characteristics of UVlight have a great effect on the attraction of insects. For this reason,if a UV lamp in a conventional insect trap is simply replaced with a UVLED, there is a problem in that the insect trapping effect can decreaserather than increase.

SUMMARY

Various embodiments are directed to an insect trap using, in place of aconventional UV lamp, a UV LED lamp that increases the insect trappingefficiency.

In an embodiment, an insect trap may include: a duct including a suctionfan therein; a UV LED lamp disposed in an air inlet portion of the duct,and including a printed circuit board (PCB) that has a UV LED chipmounted thereon; an installing portion for installing the UV LED lampon; and a trapping portion provided near the installing portion.

A plurality of UV LED chips may be mounted on the PCB, and may emit UVlight having a peak value of substantially the same wavelength.

UV light that is emitted from the UV LED chip may have a peak wavelengthof 335-395 nm.

UV light that is emitted from the UV LED chip may have a peak wavelengthof 360-370 nm.

UV light that is emitted from the UV LED chip may have a diffusion angleof 120° or less.

The UV LED lamp may have a φe/φv value of 98 or more, wherein φerepresents radiant flux having units of mW, and φv has units of lm.

UV light that is emitted from the UV LED lamp has a spectrum half-widthof 14.5 nm or less. Spectrum half-width is also called spectral linehalf-width.

Transparent housing made of a material that allows UV light to readilypass therethrough may be provided at the UV LED chip side of the UV LEDlamp, wherein the surface of the transparent housing may be roughend.

The roughened surface may be formed by sand blast process.

The radiant flux of the UV LED lamp may be 750 mW to 1500 mW.

UV light emitted from the chips of the UV LED lamp may be directedupwardly or laterally from the insect trap.

The UV LED chip includes: an n-type contact layer including an AlGaNlayer or an AlInGaN layer; a p-type contact layer including an AlGaNlayer or an AlInGaN layer; an active region having a multiple quantumwell structure, located between the n-type contact layer and the p-typecontact layer; and at least one electron control layer located betweenthe n-type contact layer and the active region. Also, the active regionhaving the multiple quantum well structure may include barrier layersand well layers, the barrier layers may be formed of AlInGaN or AlGaN,and a first barrier layer located closest to the n-type contact layermay have an Al content higher than those of other barrier layers.Meanwhile, the electron control layer is formed of AlInGaN or AlGaN, andhas an Al content higher than those of layers adjacent thereto so as tointerfere with the flow of electrons moving into the active region. Thismay reduce the mobility of electrons, thereby increasing therecombination rate of electrons and holes in the active region.

In particular, the first barrier layer may also be formed so as tointerfere with the flow of electrons, and thus the flow of electrons maybe effectively delayed by the first barrier layer and the electroncontrol layer.

Herein, the well layers may be formed of InGaN.

Meanwhile, when the barrier layers contain indium (In), the latticemismatch between the well layers and the barrier layers may be reduced,thereby improving the crystal quality of the well layers.

The first barrier layer located closest to the n-type contact layer mayhave an Al content that is higher than those of other barrier layers byat least 5%, at least 10% or at least 20%. In some embodiments, thefirst barrier layer located closest to the n-type contact layer may havean Al content of 30-50%.

In the specification, the content of each metal element is expressed asthe percentage of the content of each metal element relative to the sumof the contents of metal elements in a gallium nitride-based layer. Inother words, the content of Al in a gallium nitride-based layerrepresented by AlxInyGazN is expressed as a percentage (%) according tothe equation 100×x/(x+y+z). Generally, the sum of x, y and z is 1(x+y+z=1), and thus the percentage of each metal element generallycorresponds to a value obtained by multiplying the composition ratio (x,y or z) by 100.

Meanwhile, barrier layers other than the first barrier layer may beformed of an AlInGaN or AlGaN having an Al content of 10-30% and an Incontent of 1% or less.

In an embodiment, the first barrier layer may be formed of an AlInGaNhaving an In content of 1% or less.

In some embodiments, the p-type contact layer may include a lowerhigh-concentration doped layer, an upper high-concentration doped layer,and a low-concentration doped layer located between the lowerhigh-concentration doped layer and the upper high-concentration dopedlayer. Also, the low-concentration doped layer has a thickness greaterthan those of the lower and upper high-concentration doped layers. Whenthe low-concentration doped layer is formed to have a relatively thickthickness, the absorption of light by the p-type contact layer may beprevented.

In addition, the n-type contact layer may include a lower aluminumgallium nitride layer, an upper aluminum gallium nitride layer, and amultilayered intermediate layer located between the lower aluminumgallium nitride layer and the upper aluminum gallium nitride layer. Whenthe multilayered intermediate layer is disposed in the intermediateportion of the n-type contact layer, the crystal quality of epitaxiallayers that are formed on the n-type contact layer may be improved.Particularly, the multilayered intermediate layer may have a structureformed by alternately depositing AlInN and GaN.

The n-type contact layer may include a modulation-doped AlGaN layer. Theupper aluminum gallium nitride layer may be a modulation-doped layer.

Meanwhile, the UV LED chip may further include: a superlattice layerlocated between the n-type contact layer and the active region; and anelectron injection layer located between the superlattice layer and theactive region. The electron injection layer may have an n-type impuritydoping concentration higher than that of the superlattice layer, and thefirst barrier layer may come into contact with the electron injectionlayer. When the first barrier layer is disposed so as to come intocontact with the electron injection layer having a relatively highn-type impurity doping concentration, the flow of electrons mayeffectively be delayed.

In addition, the UV LED chip may further include an electrostaticdischarge preventing layer located between the n-type contact layer andthe superlattice layer, and a first electron control layer may bedisposed between the electrostatic discharge preventing layer and thesuperlattice layer. The electrostatic discharge preventing layerfunctions to prevent electrostatic discharge by restoring crystalquality reduced by doping of an impurity into the n-type contact layerincluding AlGaN or AlInGaN.

In some embodiments, the electrostatic discharge preventing layer mayinclude: an undoped AlGaN layer; a low-concentration AlGaN layer dopedwith an n-type impurity at a concentration lower than that of the n-typecontact layer; and a high-concentration AlGaN layer doped with an n-typeimpurity at a concentration higher than that of the low-concentrationAlGaN layer, in which the low-concentration AlGaN layer may be locatedbetween the undoped AlGaN layer and the high-concentration AlGaN layer.The undoped AlGaN layer functions to restore crystal quality, and thecrystal quality of layers being grown thereon is maintained by slowlyincreasing the doping concentration. In addition, the first electroncontrol layer may come into contact with the high-concentration AlGaNlayer. When the first electron control layer is disposed so as to comeinto contact with the high-concentration AlGaN layer, the flow ofelectrons may be effectively delayed.

The n-type contact layer and the superlattice layer may have an Alcontent of less than 10%, and the first electron control layer may havean Al content of 10-20%.

Meanwhile, a second electron contact layer may be located between then-type contact layer and the electrostatic discharge preventing layer.In addition, the n-type contact layer and the electrostatic dischargepreventing layer may have an Al content of less than 10%, and the secondelectron control layer may have an Al content of 10-20%.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a side view of an insect trap according to the firstembodiment of the present disclosure.

FIG. 2 is a side cross-sectional view of an insect trap according to thefirst embodiment of the present disclosure.

FIG. 3 is an enlarged view of a portion of a UV LED lamp used in aninsect trap of the present disclosure.

FIG. 4 is a perspective view of an insect trap according to the secondembodiment of the present invention.

FIG. 5 is a cross-sectional view illustrating a UV LED chip according toan embodiment of the present disclosure.

FIG. 6 is a cross-sectional view illustrating the multiple quantum wellstructure of a UV LED chip according to an embodiment of the presentdisclosure.

FIG. 7 is a schematic band diagram illustrating an energy band gapaccording to an embodiment of the present disclosure.

FIG. 8 is a schematic cross-sectional view illustrating a UV LED chiphaving electrodes according to an embodiment of the present disclosure.

FIG. 9 is a graph showing the light outputs of UV LED chips according toembodiments of the present disclosure.

DETAILED DESCRIPTION

Exemplary embodiments will be described below in more detail withreference to the accompanying drawings. The disclosure may, however, beembodied in different forms and should not be constructed as limited tothe embodiments set forth herein. Rather, these embodiments are providedso that this disclosure will be thorough and complete, and will fullyconvey the scope of the disclosure to those skilled in the art.Throughout the disclosure, like reference numerals refer to like partsthroughout the various figures and embodiments of the disclosure.

1st Embodiment

FIG. 1 is a side view of an insect trap according to the presentdisclosure, FIG. 2 is a side cross-sectional view of the insect trapaccording to the present disclosure, and FIG. 3 is an enlarged view of aportion of a UV LED lamp used in the insect trap of the presentdisclosure.

The insect trap of the present disclosure includes a second housing 18formed in a cover shape at the top of the insect trap, a first housing17 disposed below the second housing 18 so as to be spaced aparttherefrom, and a plurality of elongate connecting members 16 configuredto fix the second housing 18 and the first housing 17 to each other in aspaced state.

A lamp support unit 19 is disposed at the bottom of the second housing18, and a UV LED lamp 5 is supported thereby and is electricallyconnected to a power source. As shown in FIG. 2, the UV LED lamp 5supported by the lamp support unit 19 is located in the spacing “a”between the first housing 17 and the second housing 18 so as to becloser to the second housing 18.

In the first housing 17, a duct 10 is formed vertically, and in the duct10, a suction fan 13 configured to suck air along the lengthwisedirection of the duct 10 is disposed. Thus, as the suction fan 13rotates, air is sucked from an air inlet 11 to an air outlet 15.

In the lower portion of the first housing 17, there is provided atrapping portion 80 capable of trapping insects sucked together with airby the suction fan 13. The trapping portion 80 includes a net so thatair sucked by the suction fan 13 is easily removed from the trappingportion 80 so that no pressure rising occurs in the trapping portion 80,while insects do not come out of the trapping portion 80.

The UV LED lamp 5 includes UV LED chips 50 mounted on a printed circuitboard (PCB) 52 having a long flat plate shape. A plurality (for example,about eight) of UV LED chips 5 are disposed on one side of the PCB 52 soas to be spaced apart from one another along the lengthwise direction ofthe PCB 52. On the other side of the PCB 52, there is disposed aheat-dissipating pin 58 serving to dissipate the heat generated in theUV LED chip, and at the UV LED chip side, there is provided atransparent housing 56 made of a material that allows UV light toreadily pass therethrough. In addition, on both ends of the UV LED lamp,there is disposed a terminal 54 that is connected to the power terminalof the lamp support unit 19 in order to supply power to the PCB 52.

The plurality of UV LED chips 50 disposed on the PCB 52 are configuredto have a peak at substantially the same wavelength. In this case, theheight of the peak at the wavelength becomes higher while the width ofthe peak is not increased, and thus the UV LED chips can emit verystrong UV light in a specific wavelength range.

The UV LED lamp 5 of the present disclosure is disposed in the air inletportion of the duct so that UV light emitted from the UV LED chips 50 isdirected toward the inside of the duct 10. Thus, UV light emitted fromthe UV LED lamp is concentrated toward the inside of the duct 10, unlikea conventional black light (BL) lamp. For this concentration, thediffusion angle of UV light that is emitted from the UV LED chip ispreferably limited to 120° or less.

When an insect trap having the UV LED lamp is configured as describedabove, the point light source will irradiate UV light concentricallytoward the duct, and thus the intensity of the UV light will becomestronger, and insects located far apart from the UV LED lamp will beattracted to a region below the UV LED lamp. Meanwhile, as shown in FIG.2, the flow of air occurs in the air inlet 11, and this flow of air isstronger as it is closer to the first housing 17 than to the secondhousing 18 in the spacing “a” between the two housings. Thus, when theUV LED lamp disposed closer to the second housing 18 is configured toirradiate UV light toward the first housing 17, insects will beattracted concentrically to a space below the UV LED lamp and suckedsecurely into the trapping portion by the strong flow of air.

In addition, the UV LED lamp according to the present disclosure, has apoint light source that illuminates the duct 10, particularly thesuction fan 13. The high-speed rotation of the suction fan 13 influencesthe form of UV light passing through the suction fan 13 so that UV lightilluminated into the trapping portion 80 below the suction fan 13 isvery dynamically illuminated to insects located far apart from theinsect trap, thereby attracting the insects close to the insect trap.Also, the insects that came close to the insect trap are attracted to aspace below the UV LED lamp and trapped in the trap, in which strongerUV light is present, as described above.

The following shows the results of performing insect trappingexperiments using the insect trap using the UV LED lamp according to thepresent disclosure and an insect trap using a conventional black light(BL) lamp under the same conditions.

The specifications of the two lamps are shown in Table 1 below.

TABLE 1 Current Power Wp [nm] Fw [nm] Φe [mW] Voltage (Amps (Watt PeakSpectrum Radiant Φv [V] [A]) [W]) PF wavelength half-width flux [lm] UVLED lamp 220.1 0.034 4.98 0.66 367.94 9.24 759.19 5.7 Black light lamp220.1 0.247 6.4 0.12 365.88 18.36 528.8 8.37

As can be seen in Table 1 above, the two lamps have similar peakwavelengths (about 365 nm), but the spectrum half-width of the UV LEDlamp is only the half of that of the BL lamp, and the intensity of UVlight versus visible light is 133 mW/lm for the UV LED lamp, which is atleast two times greater than 63 mW/lm for the BL lamp.

Using these insect traps, an experiment was performed twice in anoutdoor stall, and the number of individuals, which were attracted andtrapped overnight (trap index), is shown in Table 2 below.

TABLE 2 % Mean ratio Common name Trap index (S.D.) Species (vectordisease) B/L LED B/L LED Aedes vexans Aedes vexans 1 7 12.5  87.5  (westnile fever) 0 0 (-) (-) Anopheles Anopheles sinensis 296 1,028   16.8b²⁾83.2a sinensis (malaria) 316 2,500 (7.9) (7.9) Culex pipiens Culexpipiens 118 497 17.8b 82.2a (west nile fever) 104 536 (2.1) (2.1) Cx.Cx. 687 3,307 14.8b 85.2a tritaeniorhynchus tritaeniorhynchus 452 3,196(3.4) (3.4) (J. encephalitis) Mansonia Mansonia uniforms 145 269 26.5b73.5a uniforms 80 368 (12.1)  (12.1)  Total 1,247 5,108 16.1b 83.9a 9526,600 (4.9) (4.9)

As can be seen from the experimental results in Table 2 above, the useof the insect trap according to the present disclosure shows insecttrapping efficiency that is at least 5 times higher than that of the useof the conventional BL lamp insect trap.

This result is because the φe/φv value of the UV LED lamp is greaterthan that of the BL lamp, and/or the half-width of the peak of the UVLED lamp is smaller than that of the BL lamp, and thus UV light isconcentrated on a peak at a specific wavelength.

Since the target of above experiment was mosquitoes, the result of theexperiment is reliable at least for mosquitoes.

2nd Embodiment

FIG. 4 is a perspective view of an insect trap according to the secondembodiment of the present invention. The insect trap shown in FIG. 4 isa product named Luralite made by P&L Systems Ltd. The same UV LED lampas the first embodiment is used for the second embodiment. The UV LEDlamp is installed so as to emit UV light upwardly as seen in FIG. 4. UVlight does not have to be emitted upwardly, but it is desirable that theUV LED lamp is installed so as not to emit the UV light directly towardhuman bodies in the living space.

The experiments are performed in the cases that radiant flux of the UVLED lamps are different, that UV light is uniformly surface-emitted fromthe housing of the UV LED lamp roughened by sand blast process or isspot-emitted directly from the chips of the UV LED lamp, and that thewavelength of UV light of the UV LED lamps are different.

Experiment 1

The 1st experiment is attractant competition between 500 mW and 1,000 mWof radiant flux for uniformalized 365 nm LED UV lights using Luralitetraps against house flies (Musca domestica) in a dark laboratorycondition.

House fly collection rates were compared between 500 mW and 1,000 mWwith uniformalized 365 nm LED UV lights using Luralite traps against 50Musca domestica. The experiment site was a screened enclosure(1.8×3.7×1.8 m) in a dark laboratory. The experiments were conducted thepaired tests in simultaneous exposure conditions for 1, 2, 4, 8, and 12hours from the morning, Room Temp.: 27±1° C., RH: 64±4%, 2 replicates.

The collection rates of 1,000 mW for uniformalized 365 nm LED UV lightswere significantly higher than those of 500 mW against house flies at 8and 12 hour exposure periods (see Table 1). As a result, 1,000 mWradiant flux for uniformalized 365 nm LED UV lights was more effectivethan 500 mW for house fly light traps.

TABLE 3 Comparisons of collection rates between 500 mW and 1,000 mWradiant flux for uniformalized 365 nm UV LED light using Luralite frytraps against 50 Musca domestica in a screened enclosure in a darkcondition for 12 hours from the morning, four replicates. ExposureCumulative % Mean Collection (S.D) Period (hr) 500 mW 1,000 mW Total 1   18.0 ± 10.1a¹⁾ 23.5 ± 2.5a  41.5 ± 10.0 2 25.0 ± 9.5a 37.0 ± 7.7a 62.0 ± 11.0 4 32.5 ± 9.0a 50.0 ± 9.4a 82.5 ± 3.8 8 33.5 ± 8.7b 64.0 ±7.8a 97.5 ± 3.0 12 34.0 ± 7.8b 66.0 ± 7.8a 100.0 ± 0.0  ¹⁾Means in thesame rows followed by the same letter are not significantly different(p > 0.05; paired t-test using SPSS PC software).

Experiment 2

The 2nd experiment is attractant competition between 500 mW and 1,000 mWof radiant flux for direct 365 nm LED UV Lights using Luralite trapsagainst house flies (Musca domestica) in a dark laboratory condition.

House fly collection rates were compared between 500 mW and 1,000 mWwith direct (not uniformalized) 365 nm LED UV lights using Luralitetraps against 50 Musca domestica. The experiment site was a screenedenclosure (1.8×3.7×1.8 m) in a dark laboratory. The experiments wereconducted the paired tests in simultaneous exposure conditions for 1, 2,4, 8, and 12 hours from the morning, Room Temp.: 27±1° C., RH: 64±4%, 4replicates.

The collection rates of 1,000 mW for direct (not uniformalized) 365 nmLED UV lights were significantly higher than those of 500 mW againsthouse flies at all exposure periods (Table 2). As a result, 1,000 mWradiant flux for direct (not uniformalized) 365 nm LED UV lights wasmore effective than 500 mW for house fly light traps.

TABLE 4 Comparisons of collection rates between 500 mW and 1,000 mWradiant flux for direct (not uniformalized) 365 nm UV LED light usingLuralite fry traps against 50 Musca domestica in a screened enclosure ina dark condition for 12 hours from the morning, four replicates.Exposure Cumulative % Mean Collection (S.D) Period (hr) 500 mW 1,000 mWTotal 1    7.5 ± 3.4b¹⁾ 18.0 ± 3.7a 25.5 ± 6.4 2 14.0 ± 4.3b 26.0 ± 2.3a10.0 ± 4.3 4 18.0 ± 3.7b 45.0 ± 3.8a 63.0 ± 5.3 8 28.5 ± 5.7b 60.5 ±8.7a 89.0 ± 6.0 12 30.0 ± 4.3b 70.0 ± 4.3a 100.0 ± 0.0  ¹⁾Means in thesame rows followed by the same letter are not significantly different(p > 0.05; paired t-test using SPSS PC software).

Experiment 3

The 3rd experiment is attractant competition between direct (notuniformalized) and uniformalized UV lights of 365 nm LED at 1,000 mWusing Luralite traps against house flies (Musca domestica) in a darklaboratory condition.

House fly collection rates were compared between direct (notuniformalized) and uniformalized UV lights at 365 nm LED of both 1,000mW radiant flux using Luralite traps against 50 Musca domestica. Theexperiment site was a screened enclosure (1.8×3.7×1.8 m) in a darklaboratory. The experiments were conducted the paired tests insimultaneous exposure conditions for 1, 2, 4, 8, and 12 hours from themorning, Room Temp.: 26±1° C., RH: 62±4%, 4 replicates.

The collection rates of uniformalized 365 nm LED UV lights weresignificantly higher than those of direct (not uniformalized) lightsagainst house flies on 2, 4, 8, and 12 hour exposure periods (Table 3).As a result, uniformalized 365 nm LED UV lights at 1,000 mW effectedmore for house fly light traps than direct (not uniformalized) 365 nmLED UV lights.

TABLE 5 Comparisons of collection rates between direct (notuniformalized) and uniformalized 365 nm UV LED light in 1,000 mW usingLuralite fry traps against 50 Musca domestica in a screened enclosure ina dark condition for 12 hours from the morning, four replicates.Exposure Cumulative % Mean Collection (S.D) Period (hr) NotUniformalized Uniformalized Total 1    3.0 ± 1.2a¹⁾ 7.0 ± 2.6a 10.0 ±2.3 2  6.5 ± 4.1b 29.5 ± 12.8a  36.0 ± 12.8 4 15.0 ± 8.4b 52.0 ± 10.5a67.0 ± 9.0 8 22.0 ± 8.5b 76.0 ± 10.3a 98.0 ± 2.8 12 22.5 ± 9.1b 77.5 ±9.1a  100.0 ± 0.0  ¹⁾Means in the same rows followed by the same letterare not significantly different (p > 0.05; paired t-test using SPSS PCsoftware) .

Experiment 4

The 4th experiment is attractant competition between 340 nm and 365 nmof UV LED lights using Luralite traps against house flies (Muscadomestica) in a dark laboratory condition.

At first, house fly collection rates were compared between 340 nm and365 nm at both 500 mW of electrical power with uniformalized LED lightsusing Luralite traps against 50 Musca domestica. The experimental sitewas a screened enclosure (1.8×3.7×1.8 m) in a dark laboratory. Theexperiments were conducted the paired tests in simultaneous exposureconditions for 1, 2, 4, 8, and 12 hours from the morning, Room Temp.:26±1° C., RH: 64±4%.

Next, house fly collection rates were compared between 340 nm at 500 mWand 365 nm at 1,000 mW of radiant flux with uniformalized LED lightsusing Luralite traps against 50 Musca domestica. The experimental sitewas the same with the previous described enclosure. The experiments wereconducted the paired tests in simultaneous exposure conditions for 1, 2,4, 8, and 12 hours from the morning, Room Temp.: 26±1° C., RH: 64±4%.

The collection rates of 365 nm LED UV lights were significantly higherthan those of 340 nm LED UV at both 500 mW against house flies at 8 and12 hours (Table 4-1). The collection rates of 365 nm LED UV lights at1,000 mW were significantly higher than those of 340 nm LED UV at 500 mWagainst house flies at 4, 8, and 12 hours (Table 4-2). As a result, 365nm LED UV lights was more effective than 365 nm LED UV lights for housefly light traps.

TABLE 6-1 Comparisons of collection rates between 340 nm and 365 nm atboth 500 mW radiant flux with uniformalized LED lights using Luralitefly traps against 50 Musca domestica in a screened enclosure in a darkcondition for 12 hours from the morning, two replicates. ExposureCumulative % Mean Collection (S.D) Period (hr) 365 nm 340 nm Total 1  11.0 ± 1.4a¹⁾  3.0 ± 1.4a 14.0 ± 0.0 2 23.0 ± 4.2a  5.0 ± 1.4a 28.0 ±2.8 4 56.0 ± 5.7a 11.0 ± 1.4a 67.0 ± 4.2 8 79.0 ± 7.1a 14.0 ± 0.0b 93.0± 7.1 12 84.0 ± 2.8a 16.0 ± 2.8b 100.0 ± 0.0  ¹⁾Means in the same rowsfollowed by the same letter are not significantly different (p > 0.05;paired t-test using SPSS PC software) .

TABLE 6-2 Comparisons of collection rates between 340 nm at 500 mW and365 nm at 1,000 mW of radiant flux with uniformalized LED lights usingLuralite fly traps against 50 Musca domestica in a screened enclosure ina dark condition for 12 hours from the morning, two replicates. ExposureCumulative % Mean Collection (S.D) Period (hr) 365 nm 340 nm Total 1  16.0 ± 2.8a¹⁾  4.0 ± 0.0a 20.0 ± 2.8 2 29.0 ± 7.1a  7.0 ± 1.4a 36.0 ±8.5 4 60.0 ± 2.8a 11.0 ± 1.4b 71.0 ± 4.2 8 85.0 ± 1.4a 13.0 ± 1.4b 98.0± 0.0 12 87.0 ± 1.4a 13.0 ± 1.4b 100.0 ± 0.0  ¹⁾Means in the same rowsfollowed by the same letter are not significantly different (p > 0.05;paired t-test using SPSSPC software).

Experiment 5

The 5th experiment is Attractant Effect of 365 nm uniformalized LED UVlights of 1,000 mW using a Luralite trap against house flies (Muscadomestica) in a dark laboratory condition.

House fly collection rates were evaluated 365 nm at 1,000 mW ofelectrical power with uniformalized LED lights using Luralite trapsagainst 50 Musca domestica. The experimental site was a screenedenclosure (1.8×3.7×1.8 m) in a dark laboratory for 1. 2, 4, 8, and 12hours from the morning, Room Temp.: 26±1° C., RH: 64±4%.

The collection rates of uniformalized 365 nm LED UV lights at 1,000 mWwere very high such as 58.5%, 88.5%, and 100.0% after 4, 8, and 12 hourexposures, respectively (Table 5).

TABLE 7 Collection rates (%) of 1,000 mW electrical power ofuniformalized 365 nm UV LED light using Luralite trap against 50 Muscadomestica in a screened enclosure in a dark condition for 1, 2, 4, 8 and12 hour exposure periods from 9:00, four replicates. Replicate ExposurePeriod (hr) number 1 2 4 8 12 # 1 10.0 32.0 68.0 96.0 100.0 # 2 6.0 24.052.0 86.0 100.0 # 3 8.0 28.0 60.0 90.0 100.0 # 4 8.0 26.0 54.0 82.0100.0 Mean 8.0 27.5 58.5 88.5 100.0 (S.D.) (1.6) (3.4) (7.2) (6.0) (0.0)

As can be seen from the experimental results of experiment 1 andexperiment 2, fly collection rate is much higher in the condition thatradiant flux is higher. As can be seen from the experimental results ofexperiment 3, UV light uniformly surface-emitted from the roughenedsurface has higher fly collection rate than that of UV light directlyemitted from the UV led chips. As can be seen from the experimentalresults of experiment 4, UV light that has a peak wavelength of 365 nmhas higher fly collection rate than that of UV light that has a peakwavelength of 340 nm.

As can be seen from the experimental results of these experiments,uniformly surface-emitted UV light that has higher radiant flux and peakwavelength of 365 nm has higher fly collection rate. It is moreefficient when the radiant flux is near 1000 mW than 500 mW. Butperformance degradation would be caused by the high temperature when itis used for a long time, since too high radiant flux also makes too muchheat compared with the limit of heat radiation efficiency. So it isimportant to limit the maximum radiant flux in order to avoidperformance degradation due to heat. It is confirmed from additionalexperiments that UV light emitting efficiency does not decrease even ifit is used for a long time when the radiant flux of the UV LED lamp is750 mW to 1500 mW.

The fly collection efficiency of uniformly surface-emitted UV light thathas 1,000 mW radiant flux and peak wavelength of 365 nm can be seen fromthe experimental results of experiment 5.

Meanwhile, the UV LED chip that is used in the insect trap of thepresent disclosure has the following structure having the effect ofemitting UV light with high efficiency.

FIG. 5 is a cross-sectional view illustrating a UV LED chip according toan embodiment of the present disclosure, and FIG. 6 is an enlargedcross-sectional view illustrating the multiple quantum well structure ofa UV LED chip according to an embodiment of the present disclosure.

Referring to FIG. 5, the UV LED chip includes an n-type contact layer27, an electrostatic discharge preventing layer 30, a superlattice layer35, an active region 39, a p-type contact layer 43, and electron controllayers 28 and 34. In addition, the UV LED chip may further include asubstrate 21, a nucleation layer 23, a buffer layer 25, an electroninjection layer 37, an electron blocking layer 41 or a delta-doped layer45.

The substrate 21 is a substrate on which a gallium nitride-basedsemiconductor layer is to be grown. It may be a sapphire, SiC or spinelsubstrate, etc., but is not specifically limited thereto. For example,it may be a patterned sapphire substrate (PSS).

The nucleation layer 23 may be formed of (Al, Ga)N at a temperature of400˜600° C. in order to allow the buffer layer 25 to grow on thesubstrate 21. For example, it is formed of GaN or AlN. The nucleationlayer may be formed to have a thickness of about 25 nm. The buffer layer25 serves to suppress the occurrence of defects such as dislocationbetween the substrate 21 and the n-type contact layer 27, and is grownat a relatively high temperature. For example, the buffer layer 25 maybe formed of undoped GaN to a thickness of about 1.5 μm.

The n-type contact layer 27 is formed of a gallium nitride-basedsemiconductor layer doped with an n-type impurity, for example, Si, andmay be formed to have a thickness of, for example, about 3 μm. Then-type contact layer 27 may include an AlGaN layer or an AlInGaN layer,and may have a single layer or multi-layer structure. For example, asshown in the figure, the n-type contact layer 27 may include a lower GaNlayer 27 a, an intermediate layer 27 b and an upper AlGaN layer 27 c.Herein, the intermediate layer 27 b may be formed of AlInN or may beformed to have a multi-layer structure (including a superlatticestructure) composed of, for example, about 10 alternating layers ofAlInN and GaN. The lower GaN layer 27 a may be formed to have athickness of about 1.5 μm, and the upper AlGaN layer 27 c may be formedto have a thickness of about 1 μm. The upper AlGaN layer 27 c may havean Al content of less than 10%, for example, about 9%.

The intermediate layer 27 b is formed to have a thickness smaller thanthat of the upper AlGaN layer 27 c, and may be formed to have athickness of about 80 nm. The crystallinity of the upper AlGaN layer 27c can be increased by forming the intermediate layer 27 b on the lowerGaN layer 27 a and forming the upper AlGaN layer 27 c thereon.

In particular, a Si impurity is doped into the lower GaN layer 27 a andthe upper AlGaN layer 27 c at a concentration of 1E18/cm³ or higher. Theintermediate layer 27 b may be doped to a level equal to or lower thanthat of the upper AlGaN layer 27 c, and may not be intentionally dopedwith any impurity. Further, the upper AlGaN layer 27 c may be formed ofa modulation-doped layer by repeating doping and undoping.

The lower GaN layer 27 a and the upper AlGaN layer 27 c are doped with ahigh concentration of an impurity, and thus the resistance component ofthe n-type contact layer 27 can be reduced. An n-electrode 49 a (seeFIG. 8) that comes into contact with the n-type contact layer 27 maycome into contact with the upper AlGaN layer 27 c. Particularly, when aUV LED chip having a vertical structure is to be formed by removing thesubstrate 21, the lower GaN layer 27 a and the intermediate layer 27 bmay also be removed.

The electron control layer 28 is placed on the n-type contact layer 27so as to come into contact with the n-type contact layer 27.Particularly, the electron control layer 28 is placed on a layer thatcomes into contact with the n-electrode 49 a, for example, the upperAlGaN layer 27 c. The electron control layer 28 may have an Al contenthigher than that of the n-type contact layer 27, and may be formed ofAlGaN or AlInGaN. For example, the Al content of the electron controllayer 28 may range from 10% to 20%. The electron control layer 28 may beformed to have a thickness of about 1-10 nm.

The electron control layer 28 has an Al content higher than that of then-type contact layer 27, and thus serves to interfere with the migrationof electrons from the n-type contact layer 27 to the active region 39.Accordingly, the electron control layer 28 serves to control themobility of electrons, thereby increasing the recombination rate ofelectrons and holes in the active region 39.

The electrostatic discharge preventing layer 30 is formed in order toimprove the crystal quality of an epitaxial layer to be formed thereon.The electrostatic discharge preventing layer 30 may include an undopedAlGaN layer 29, a low-concentration AlGaN layer 31 and ahigh-concentration AlGaN layer 33. The undoped AlGaN layer 29 may beformed of intentionally undoped AlGaN, and may be formed to have athickness smaller than that of the upper AlGaN layer 27 c, for example,a thickness of 80 nm to 300 nm. As the n-type contact layer 27 is dopedwith an n-type impurity, residual stress is produced in the n-typecontact layer 27, and the crystal quality is reduced. Also, as theelectron control layer 28 having a relatively high Al content is formed,the crystal quality is reduced. For this reason, when another epitaxiallayer is grown on the n-type contact layer 27 or the electron controllayer 28, it will be difficult to form an epitaxial layer having goodcrystal quality. However, because the undoped AlGaN layer 29 is notdoped with an impurity, it acts as a restoration layer that restores thereduced crystal quality of the n-type contact layer 27. Thus, in apreferred embodiment, when the electron control layer 28 is omitted, theundoped AlGaN layer 29 is formed directly on the n-type contact layer 27so as to come into contact with the n-type contact layer 27, and whenthe electron control layer 28 is formed, the undoped AlGaN layer 29 isformed directly on the electron control layer 28 so as to come intocontact with the electron control layer 28. In addition, because theundoped AlGaN layer 29 has a resistivity higher than that of the n-typecontact layer 27, electrons that flow from the n-type contact layer 27into the active layer 39 can be uniformly dispersed in the n-typecontact layer 27 before they pass through the undoped AlGaN layer 29.

The low-concentration AlGaN layer 31 is placed on the undoped GaN layer29, and has an n-type impurity doping concentration lower than that ofthe n-type contact layer 27. The low-concentration AlGaN layer 31 mayhave a Si doping concentration in the range of, for example, 5×10¹⁷/cm³to 5×10¹⁸/cm³, and may be formed to have a thickness smaller than thatof the undoped AlGaN layer 29, for example, a thickness of 50-150 nm.Meanwhile, the high-concentration AlGaN layer 33 is placed on thelow-concentration AlGaN layer 31, and has an n-type impurity dopingconcentration higher than that of the low-concentration AlGaN layer 31.The high-concentration AlGaN layer 33 may have a Si doping concentrationthat is substantially similar to that of the n-type contact layer 27.The high-concentration AlGaN layer 33 may be formed to have a thicknesssmaller than that of the low-concentration AlGaN layer 31, for example,a concentration of about 30 nm.

The n-type contact layer 27, the electron control layer 28, the undopedAlGaN layer 29, the low-concentration AlGaN layer 31 and thehigh-concentration AlGaN layer 33 can be continuously grown by feedingmetal gas sources into a chamber. As the metal gas sources, organicsources for aluminum (Al), gallium (Ga) and/or indium (In), for example,trimethyl aluminum (TMA), trimethyl gallium (TMG) and/or trimethylindium (TMI), are used. Meanwhile, as a source gas for Si, SiH₄ may beused. These layers may be grown at a first temperature, for example,1050° C. to 1150° C.

The electron control layer 34 is placed on the electrostatic dischargepreventing layer 30. Particularly, the electron control layer 34 isplaced in contact with the high-concentration AlGaN layer 33. Theelectron control layer 34 has an Al content higher than that of theelectrostatic discharge preventing layer 30, and may be formed of AlGaNor AlInGaN. For example, the Al content of the electron control layer 34may range from 10% to 20%. The electron control layer 34 may be formedto have a thickness of about 1-10 nm.

Because the electron control layer 34 has an Al content higher than thatof the electrostatic discharge preventing layer 30, it serves tointerfere with the migration of electrons from the n-type contact layer27 to the active layer 39. Thus, the electron control layer 34 functionsto control the mobility of electrons to thereby increase therecombination rate of electrons and holes in the active region 39.

The superlattice layer 35 is placed on the electron control layer 34.The superlattice layer 35 can be formed, for example, by depositingabout 30 alternating layers of a first AlInGaN layer and a secondAlInGaN layer, which have different compositions, in such a manner thateach of the layers has a thickness of 20 Å. The first AlInGaN layer andthe second AlInGaN layer have a band gap larger than that of well layers39 w (see FIG. 6) in the active region 39. The content of indium (In) ineach of the first AlInGaN layer and the second AlInGaN layer may belower than the content of indium (In) in the well layers 39 w, but isnot limited thereto, and at least one of the first AlInGaN layer and thesecond AlInGaN layer may have an In content higher than that of the welllayers 39 w. For example, the layer having a higher In content among thefirst AlInGaN layer and the second AlInGaN layer may have an In contentof about 1% and an Al content of about 8%. The superlattice layer 35 maybe formed of an undoped layer that is not intentionally doped with anyimpurity. Because the superlattice layer 35 is formed of an undopedlayer, it can reduce the leakage current of the UV LED chip.

The superlattice layer 35 can act as a buffer layer for an epitaxiallayer formed thereon, and thus improves the crystal quality of theepitaxial layer.

The electron injection layer 37 has an n-type impurity dopingconcentration higher than that of the superlattice layer 35. Inaddition, the electron injection layer may have an n-type impuritydoping concentration that is substantially equal to that of the n-typecontact layer 27. For example, the n-type impurity doping concentrationmay range from 2×10¹⁸/cm³ to 2×10¹⁹/cm³, and preferably from 1×10¹⁹/cm³to 2×10¹⁹/cm³. The electron injection layer 37 may be formed to have athickness similar to or smaller than that of the high-concentrationdoped layer 33, for example, a thickness of about 20 nm. The electroninjection layer 37 may be formed of, for example, AlGaN.

On the electron injection layer 37, the active region 39 is placed. FIG.6 is an enlarged cross-sectional view of the active region 39.

Referring to FIG. 6, the active region 39 has a multiple quantum wellstructure including barrier layers 39 b deposited alternately with welllayers 39 w. The well layers 39 w may have a composition that emits nearultraviolet light at a wavelength ranging from 360 nm to 390 nm. Forexample, the well layers 39 w may be formed of GaN, InGaN or AlInGaN.Particularly, it may be formed of InGaN. Herein, the content of indium(In) in the well layers 39 w is determined according to the requiredwavelength of near ultraviolet light. For example, the In content of thewell layers 39 w may be about 1% or less. The well layers may be formedto have a thickness of about 20-30 Å.

The barrier layers 39 b may be formed of a gallium nitride-basedsemiconductor layer, for example, GaN, InGaN, AlGaN or AlInGaN, whichhas a band gap larger than that of the well layers. Particularly, thebarriers layer may be formed of AlInGaN including In, and thus thelattice mismatch between the well layer 39 w and the barrier layer 39 bcan be reduced.

Meanwhile, among the battier layers 39 b 1, 39 b and 39 bn, the firstbarrier layer 39 b 1 located closest to the electron injection layer 37or the superlattice layer 35 may have an Al content higher than those ofthe other barrier layers. For example, the Al content of the firstbarrier layer 39 b 1 may be higher than those of the other barrierlayers 39 b by at least 5%, at least 10% or at least 20%. The Al contentof the first barrier layer 39 b 1 may, for example, range from 30% to50%. For example, the other barrier layers 39 b and 39 bn may have an Alcontent of about 20%, and the first barrier layer 39 b 1 may have an Alcontent of about 40%. The content of In in these barrier layers 39 b 1,39 b and 39 bn is about 1% or less.

Generally, barrier layers in UV LED chips are formed to have the samecomposition. However, in this embodiment, the first barrier layer 39 b 1has a higher Al content compared to other barrier layers 39 b. Becausethe first barrier layer 39 b 1 is formed to have a higher band gapcompared to other barrier layers 39 b, the first barrier layer 39 b 1can function to trap carriers in the active region 39. In addition, thefirst barrier layer 39 b 1 has an Al content higher than that of the 3superlattice layer 35 or the electron injection layer 37, and thus canfunction as an electron control layer that interferes with the flow ofelectrons.

Meanwhile, the first barrier layer preferably has a thickness that issubstantially equal to those of barrier layers other than the lastbarrier layer located closest to an electron blocking layer 41 or ap-type contact layer 43. The first barrier layer may have a thicknessof, for example, 40-60 Å, particularly about 50 Å.

The active region 39 may come into contact with the electron injectionlayer 37. Particularly, the first barrier layer 39 b 1 comes intocontact with the electron injection layer 37 so as to effectively delaythe flow of electrons. Meanwhile, the barrier layers and quantum welllayers of the active region 39 may be formed of undoped layers that arenot doped with any impurity in order to improve the crystal quality ofthe active region, but a portion or the whole of the active region mayalso be doped with an impurity in order to lower the forward voltage.

Referring to FIG. 5 again, a p-type contact layer 43 may be placed overthe active region 39, and an electron blocking layer 41 may be disposedbetween the active region 39 and the p-type contact layer 43. Theelectron blocking layer 41 may be formed of AlGaN or AlInGaN. If theelectron blocking layer 41 is formed of AlInGaN, its lattice mismatchwith the active region 39 can further be reduced. Herein, the electronblocking layer 41 may have an Al content of, for example, about 40%. Theelectron blocking layer 41 may be doped with a p-type impurity, forexample, Mg, but may not be intentionally doped with any impurity. Theelectron blocking layer 41 may be formed to have a thickness of about 15nm.

The p-type contact layer 43 may be formed of an Mg-doped AlGaN layer orAlInGaN layer, and may, for example, have an Al content of about 8% anda thickness of 100 nm. The p-type contact layer 43 may be formed of asingle layer, but is not limited thereto, and as shown in the figure,may include a lower high-concentration doped layer 43 a, alow-concentration doped layer 43 b and an upper high-concentration dopedlayer 43 c. The low-concentration doped layer 43 b has a dopingconcentration lower than those of the lower and lower high-concentrationdoped layer 43 a and 43 c, and is disposed between the lowerhigh-concentration doped layer 43 a and the upper high-concentrationdoped layer 43 c. The low-concentration doped layer 43 b can be grownwhile the feed of an MG source gas (e.g., Cp2Mg) is blocked duringgrowth. In addition, during the growth of the low-concentration dopedlayer 43 b, H₂ gas may be excluded, and N₂ gas may be used as a carriergas in order to reduce the impurity content of the layer. Also, thelow-concentration doped layer 43 b may be formed thicker than the lowerand upper high-concentration doped layers 43 a and 43 c. For example,the low-concentration doped layer 43 b may be formed to have a thicknessof about 60 nm, and each of the lower and upper high-concentration dopedlayers 43 a and 43 c may be formed to have a thickness of 10 nm.Accordingly, the loss of near ultraviolet light by the p-type contactlayer 43 can be prevented or reduced by improving the crystal quality ofthe p-type contact layer 43 and reducing the impurity concentration ofthe p-type contact layer 43.

Meanwhile, a delta-doped layer 45 may be placed on the p-type contactlayer 43 to lower ohmic contact resistance. The delta-doped layer 45 isdoped with a high-concentration n-type or p-type impurity in order tolower the ohmic contact resistance between an electrode formed thereonand the p-type contact layer 43. The delta-doped layer 45 may be formedto have a thickness of about 2-5 Å.

FIG. 7 is a schematic band diagram illustrating an energy band gapaccording to an embodiment of the present disclosure. For simplicity ofillustration, FIG. 7 schematically shows only a conduction band.

Referring to FIG. 7, an electrode control layer 28 is placed between ann-type contact layer 27 and an electrostatic discharge preventing layer30, and an electron control layer 34 is placed between the electrostaticdischarge preventing layer 30 and a superlattice layer 35. Also, a firstbarrier layer 39 b 1 in an active layer 39 is located closer to thesuperlattice layer 35 than to the well layers or other barrier layers ofthe active region 39. The electron control layers 28 and 34 have a bandgap larger than those of the layers adjacent thereto, and thus acts as abarrier against the migration of electrons from the n-type contact layer27 to the active region 39. Particularly, the electron control layer 28has a band gap larger than that of the n-type contact layer 27, and theelectron control layer 34 has a band gap larger than that of theelectrostatic discharge preventing layer 30. The first barrier layer 39b 1 also has a band gap larger than that of the superlattice layer 35 orthe electron injection layer 37, and thus acts as a barrier forelectrons that are injected from the superlattice layer 35 into theactive region 39.

As shown in FIG. 7, the electron control layers 28 and 34 together withthe first barrier layer 39 b 1 may be disposed between the n-typecontact layer 27 and the active region 39, thereby delaying the flow ofelectrons. Thus, electrons can be prevented from deviating from theactive region 39 without being recombined with holes, thereby increasingthe recombination rate of electrons and holes. A light-emitting diodeadopting the electron control layers 28 and 34 will show better effectswhen it operates at high current densities.

FIG. 8 is a schematic cross-sectional view illustrating a UV LED chiphaving electrodes according to an embodiment of the present disclosure.FIG. 8 shows a UV LED chip having a horizontal structure, fabricated bypatterning the epitaxial layers grown on a substrate 21.

Referring to FIG. 8, the UV LED chip includes, in addition to thesubstrate and epitaxial layers described with reference to FIG. 5, atransparent electrode 47, an n-electrode 49 a and a p-electrode 49 b.

The transparent electrode 47 may be formed of, for example, indium tinoxide (ITO). The p-electrode 49 b is formed on the transparent electrode47. Meanwhile, the n-electrode 49 a comes into contact with the n-typecontact layer 27, particularly the upper AlGaN layer 27 c, exposed byetching the epitaxial layers. The electron control layer 28 is placed onthe n-type contact layer 27 with which the n-electrode 49 a comes intocontact, so as to interfere with the flow of electrons from the n-typecontact layer 27 to the active region 39.

Although the UV LED chip having the horizontal structure has been shownand described in this embodiment, the scope of the present disclosure isnot limited to the UV LED chip having the horizontal structure. A UV LEDchip having a flip chip structure can be fabricated by patterning theepitaxial layers grown on the substrate 21. Alternatively, a UV LED chiphaving a vertical structure can also be fabricated by removing thesubstrate 21.

Experimental Examples

Epitaxial layers as shown in FIG. 5 were grown on a patterned sapphiresubstrate using a metal-organic chemical vapor deposition (MOCVD) systemunder the same conditions while changing only the conditions forformation of the electron control layers 28 and 34. UV LED chips ofExample 1 were samples in which the electron control layers 28 and 34were not formed, and a first barrier layer in the samples had athickness of about 5 nm and an Al content of about 40%. Meanwhile, UVLED chips of Example 2, Example 3 and Example 4 were fabricated in thesame manner as that of Example 1, except that the electron control layer28 and the electron control layer 34 were formed. Each of the electroncontrol layer 28 and the electron control layer 34 was formed to have athickness of about 5 nm. Meanwhile, the electron control layers 28 and34 in the UV LED chips of Examples 2 to 4 were formed to have Alcontents of about 10% for Example 2, about 15% for Example 3, and about20% for Example 4. The content of Al was measured using an atomic probe.Meanwhile, in each of the Examples, the content of Al in each of then-type contact layer 27 and the electrostatic discharge preventing layer33 was about 9%, and the content of Al in the superlattice layer 35 wasabout 8%.

Two wafers for each of Examples 1 to 3 were fabricated, and one waferfor Example 4 was fabricated. The light output of each of the UV LEDchips was measured at the wafer level, and the mean light output valuefor each wafer is shown in FIG. 9.

As can be seen in FIG. 9, the UV LED chips of Examples 2 and 3 havingthe electron control layers 28 and 34 formed thereon showed higher lightoutputs compared to the UV LED chip having no electron control chip. Inaddition, the light output increased as the Al content of the electroncontrol layers 28 and 34 increased.

As described above, a UV LED lamp in an insect trap according to thepresent disclosure emits UV light, which is concentrated on a peak at aspecific wavelength and is stronger than visible light, while theconsumption of energy used is reduced. In addition, the insect trappingefficiency of the insect trap can be significantly increased due to thecharacteristics of the position and direction of the UV LED lampprovided in the insect trap.

While various embodiments have been described above, it will beunderstood to those skilled in the art that the embodiments describedare by way of example only. Accordingly, the disclosure described hereinshould not be limited based on the described embodiments.

What is claimed is:
 1. An insect trap comprising: a UV LED lampincluding a printed circuit board (PCB) that has a UV LED chip mountedthereon; an installing portion for installing the UV LED lamp on; and atrapping portion provided near the installing portion.
 2. The insecttrap of claim 1, wherein a plurality of UV LED chips are mounted on thePCB, and are configured to emit UV light having a peak value ofsubstantially the same wavelength.
 3. The insect trap of claim 1,wherein a peak wavelength of UV light emitted from the UV LED chip is335 nm to 395 nm.
 4. The insect trap of claim 1, wherein a peakwavelength of UV light emitted from the UV LED chip is 360 nm to 370 nm.5. The insect trap of claim 1, wherein a diffusion angle of UV lightemitted from the UV LED chip is 120° or less.
 6. The insect trap ofclaim 1, wherein a φe/φv value of the UV LED lamp is 98 or more, inwhich φe represents a radiant flux having a unit of mW, and φv has aunit of lm.
 7. The insect trap of claim 1, wherein spectrum half-widthof UV light emitted from the UV LED lamp is 14.5 nm or less.
 8. Theinsect trap of claim 1, Wherein transparent housing made of a materialthat allows UV light to readily pass therethrough is provided at the UVLED chip side of the UV LED lamp, the surface of the transparent housingis roughend.
 9. The insect trap of claim 8, wherein the roughenedsurface is formed by sand blast process.
 10. The insect trap of claim 1,wherein the radiant flux of the UV LED lamp is 750 mW to 1500 mW. 11.The insect trap of claim 1, wherein the UV light emitted from the chipsof the UV LED lamp is directed upwardly or laterally from the insecttrap.
 12. The insect trap of claim 1, wherein the UV LED chip comprises:an n-type contact layer including an AlGaN layer or an AlInGaN layer; ap-type contact layer including an AlGaN layer or an AlInGaN layer; anactive region having a multiple quantum well structure, located betweenthe n-type contact layer and the p-type contact layer; and at least oneelectron control layer located between the n-type contact layer and theactive region, in which the active region having the multiple quantumwell structure includes barrier layers and well layers, the barrierlayers are formed of AlInGaN or AlGaN, a first barrier layer locatedclosest to the n-type contact layer has an Al content higher than thoseof other barrier layers, and the electron control layer is formed ofAlInGaN or AlGaN, and has an Al content higher than those of layersadjacent thereto so as to interfere with a flow of electrons moving intothe active region.
 13. The insect trap of claim 12, wherein the UV LEDchip further comprises: a superlattice layer located between the n-typecontact layer and the active region; and an electron injection layerlocated between the superlattice layer and the active region, in whichthe electron injection layer has an n-type impurity doping concentrationhigher than that of the superlattice layer, and the first barrier layercomes into contact with the electron injection layer.
 14. The insecttrap of claim 13, wherein the UV LED chip further comprises: anelectrostatic discharge preventing layer located between the n-typecontact layer and the superlattice layer, in which a first electroncontrol layer is disposed between the electrostatic discharge preventinglayer and the superlattice layer.
 15. The insect trap of claim 14,wherein the electrostatic discharge preventing layer comprises: anundoped AlGaN layer; a low-concentration AlGaN layer doped with ann-type impurity at a concentration lower than that of the n-type contactlayer; and a high-concentration AlGaN layer doped with an n-typeimpurity at a concentration higher than that of the low-concentrationAlGaN layer, in which the low-concentration AlGaN layer is locatedbetween the undoped AlGaN layer and the high-concentration AlGaN layer,and the first electron control layer comes into contact with thehigh-concentration AlGaN layer.
 16. The insect trap of claim 14, whereina second electron contact layer is located between the n-type contactlayer and the electrostatic discharge preventing layer.
 17. The insecttrap of claim 16, wherein the n-type contact layer comprises a loweraluminum gallium nitride layer, an upper aluminum gallium nitride layer,and a multilayered intermediate layer located between the lower aluminumgallium nitride layer and the upper aluminum gallium nitride layer. 18.The insect trap of claim 17, wherein the multilayered intermediate layerhas a structure formed by alternately depositing AlInN and GaN.
 19. Theinsect trap of claim 12, wherein the UV LED chip further comprises: ann-electrode electrically connected to the n-type contact layer, in whichthe electron control layer is located closer to the active region thanto the n-type contact layer with which the n-electrode comes intocontact.
 20. The insect trap of claim 12, wherein the well layers areformed of InGaN.